X-ray Photoelectron Spectroscopy (XPS) is an advanced analytical technique used to measure the concentration and chemical state of elements in a sample material. It works by bombarding the sample with X-rays, which cause electrons to be emitted. This emission of electrons allows for the determination of the composit…
X-ray Photoelectron Spectroscopy (XPS) is an advanced analytical technique used to measure the concentration and chemical state of elements in a sample material. It works by bombarding the sample with X-rays, which cause electrons to be emitted. This emission of electrons allows for the determination of the composition, structure, and chemical state of the material's surface. XPS is especially useful for analyzing thin films and polymers, making it an important tool for industries such as advanced materials, pharmaceuticals, and semiconductors. XPS is also used to investigate catalysts, the development of new materials, and to increase the efficiency of industrial processes.
1 peer-reviewed article, ranked by relevance. Each links to its DOI.
The 1 article above has been cited 10 times in the scholarly literature. Citation data via OpenAlex and Crossref, updated Jun 2026.
A sample of recent works citing this journal's research on X-ray Photoelectron Spectroscopy, linking to each citing work.