Scanning Force Microscopy

Scanning force microscopy (SFM) is a powerful imaging tool used to measure forces between a sharp tip and the surface of a sample, on the nanoscale. Its high spatial resolution allows users to analyze samples’ structural features, determine chemical composition, and measure mechanical and electrical properties with great accuracy. SFM is used in a variety of research and industry applications, such as materials science, biophysics, and semiconductor fabrication. Its ability to investigate nanoscale surface features and the forces between them helps to understand the behavior of devices and materials at the atomic level. This understanding can then be used to drive advances in the fields of nanotechnology, biotechnology, and more.