Electron microscopy is a family of imaging techniques that use a focused beam of electrons, rather than visible light, to examine the structure of specimens at very high magnification and resolution. Because electrons have a far shorter wavelength than light, electron microscopes can resolve features down to the nan…
Electron microscopy is a family of imaging techniques that use a focused beam of electrons, rather than visible light, to examine the structure of specimens at very high magnification and resolution. Because electrons have a far shorter wavelength than light, electron microscopes can resolve features down to the nanometer and even atomic scale, far beyond the limits of optical microscopy. The two principal forms are transmission electron microscopy, in which electrons pass through a thin sample to reveal internal structure, and scanning electron microscopy, in which a beam is scanned across a surface to produce detailed images of its topography. Electromagnetic lenses focus the beam, and specimens generally require special preparation. The technique is fundamental to materials science, nanotechnology, and biology, including structural biology, where it helps visualize cells, tissues, macromolecules, and engineered materials. The International Journal of Structural Biology, the OpenAccessPub journal hosting this page, publishes peer-reviewed, open-access research on molecular and material structure. Related OpenAccessPub work has applied scanning electron microscopy and X-ray microanalysis to study bone tissue repair around titanium nickelide mesh implants, illustrating the method's role in characterizing biological and biomaterial interfaces. This page gathers open-access scholarship relevant to electron microscopy.
12 peer-reviewed articles, ranked by relevance. Each links to its DOI.
The 12 articles above have been cited 293 times in the scholarly literature. Citation data via OpenAlex and Crossref, updated Jun 2026.
A sample of recent works citing this journal's research on Electron Microscopy, linking to each citing work.