Secondary Ion Mass Spectrometry
(SIMS) Secondary Ion Mass Spectrometry (SIMS) is a scientific method used to identify and quantify the chemical composition of a sample. It works by bombarding the sample with a focused beam of ions, which causes the ejection of secondary ions from the sample surface. These secondary ions can be measured to gain information about the sample's chemical makeup. SIMS is used in fields such as geology, biology and materials science to detect and analyze trace elements in samples. It is especially useful for searching for small molecules or isotopes within a sample at a high level of accuracy. This makes the technique a valuable tool for environmental monitoring, industrial quality control and forensic investigations.
← Journal of Developments in Mass Spectrometry