Scanning Probe Microscopy

Scanning probe microscopy (SPM) is a type of microscopic imaging technique used to measure and observe objects at a very small scale. It is used to study the surface characteristics of a sample and to map out its topography. It is capable of imaging a sample down to the size of a single atom, providing high resolution images that reveal important details about the sample's properties. SPM has a wide range of uses in materials science, biology, and chemistry, including nanomaterials research, identification of defects in surfaces, and analysis of complex surfaces. It is a valuable tool for researchers seeking to gain a better understanding of the behavior of materials and structures at the nanoscale.