Research Topic · Peer-Reviewed

Electron Microscope

An electron microscope is an instrument that uses a focused beam of electrons, rather than light, to produce highly magnified images of specimens. Because electrons have far shorter wavelengths than visible light, electron microscopes achieve resolution and magnification vastly greater than optical microscopes, enab…

Curated from this journal's research 📚 12 peer-reviewed articles cited Cited 42× across the literature 🔖 ISSN 2689-2855 🗓 Reviewed June 2026

Overview

An electron microscope is an instrument that uses a focused beam of electrons, rather than light, to produce highly magnified images of specimens. Because electrons have far shorter wavelengths than visible light, electron microscopes achieve resolution and magnification vastly greater than optical microscopes, enabling visualization of structures down to the scale of individual cells, molecules, and atoms. The two principal types—transmission electron microscopy, which passes electrons through thin samples, and scanning electron microscopy, which scans a surface to reveal its topography—are indispensable tools in materials science, nanotechnology, biology, and medicine. In nanotechnology especially, electron microscopy is central to characterizing the structure, composition, and surface features of nanoscale materials. The journal's research illustrates these uses, including "Bone Tissue Repair During Implantation of Titanium Nickelide Mesh: Scanning Electron Microscopy and X-Ray Electron Probe Microanalysis Observation" (2018), which applies scanning electron microscopy and microanalysis to examine an implant interface, and "Thin Film Deposition and Characterization Techniques" (2022), which discusses methods for analyzing engineered materials. This page gathers peer-reviewed, open-access research relevant to electron microscopy, supporting materials scientists, nanotechnologists, and researchers using electron-based imaging to characterize structures at the micro- and nanoscale.

Research published in this journal

12 peer-reviewed articles, ranked by relevance. Each links to its DOI.

How this research is being cited

The 12 articles above have been cited 42 times in the scholarly literature. Citation data via OpenAlex and Crossref, updated Jun 2026.

A sample of recent works citing this journal's research on Electron Microscope, linking to each citing work.

Editorial oversight

Curated from peer-reviewed research published in Advances in Nanotechnology (ISSN 2689-2855).

Journal editorial board
Zairov Rustem · Russia Mohamed BALLI · Canada Dr Anum Shafiq · Czech Republic

This page summarises published research for orientation; it is not medical or professional advice.