Research Topic · Peer-Reviewed

Atomic Force Microscopy

Atomic force microscopy (AFM) is a high-resolution imaging and measurement technique that enables the study and manipulation of surfaces at the nanometer and even atomic scale. Rather than using light or a beam of electrons, AFM works by scanning a very sharp probe mounted on a flexible cantilever across the surface…

Curated from this journal's research 📚 7 peer-reviewed articles cited Cited 22× across the literature 🔖 ISSN 2689-2855 🗓 Reviewed June 2026

Overview

Atomic force microscopy (AFM) is a high-resolution imaging and measurement technique that enables the study and manipulation of surfaces at the nanometer and even atomic scale. Rather than using light or a beam of electrons, AFM works by scanning a very sharp probe mounted on a flexible cantilever across the surface of a sample; tiny forces between the probe tip and the surface deflect the cantilever, and these deflections are recorded, typically by a laser, to build a detailed three-dimensional map of the surface topography. Because it senses force directly, AFM can image both conductive and non-conductive materials, often in air or even in liquid, and it can resolve features far finer than those visible with optical microscopes. Beyond imaging, AFM can measure mechanical and physical properties such as stiffness, elasticity, and adhesion, and it can be used to manipulate individual structures at the nanoscale. These capabilities make it a versatile tool in materials science, surface science, chemistry, biophysics, and the study of cells and biomolecules. As a topic within Advances in Nanotechnology, atomic force microscopy reflects the field's reliance on precise instrumentation to visualize, characterize, and engineer matter at the smallest scales, supporting research into nanomaterials and their properties.

Research published in this journal

7 peer-reviewed articles, ranked by relevance. Each links to its DOI.

How this research is being cited

The 7 articles above have been cited 22 times in the scholarly literature. Citation data via OpenAlex and Crossref, updated Jun 2026.

A sample of recent works citing this journal's research on Atomic Force Microscopy, linking to each citing work.

Editorial oversight

Curated from peer-reviewed research published in Advances in Nanotechnology (ISSN 2689-2855).

Journal editorial board
Zairov Rustem · Russia Mohamed BALLI · Canada Dr Anum Shafiq · Czech Republic

This page summarises published research for orientation; it is not medical or professional advice.